生物样品中微观形貌、内部结构检测方案(透射电镜)

HITACHI Inspire the Next Correlative light and electronmicroscopy system MirrorCLEM Facilitating Electron Microscope (EM) observation ofthe fluorescent-labeled ultra-structure Features Once Light Microscope (LM) image is aligned with EM image， EM stage can be externally controlled to thearea of interest on the fluorescent microscope image. LM image is overlaid on EM GUI on a real-time basis for easy correlative imaging. CLEM workflow with MirrorCLEM Regulus FE-SEM Overlaid SEM and fluorescence image Specimen： Cotyledon cells of Arabidopsis thaliana Acc. Voltage ：5 kV， Mag.：x5 k， Signal ： Peroxisome-GFP & DIC (Confocal laser scanning micrographs)， YAG-E age) Specimen courtesy by Kiminori Toyooka， RIKEN CSRS @HHitachi High-Technologies