GaN中发射光谱，激发光谱检测方案(分子荧光光谱)

Document N°10031-PL-V1-CJobin Yvon SA 08/2002Page2 Low Temperature MacroPhotoluminescence andPLE Sustem Modularity and versatility Many configurationsavailable Fully automated devices Multichannel detection Controlled by DataMaxTM Figure 1： FluoroLog-3@ system incorporating a closed cycle heliumcryostat The Jobin Yvon FluoroLog-3@ system makes an ideal turnkey macro PL / PLE system.The large format sample chamber allows the easy installation of a standard heliumcryostat for low temperature studies. The system is controlled by the Jobin Yvon DataMaxTM software， which can performexcitation， emission， time base and synchronous scans in both eV and nm units. Fluorescence Division www.jyhoriba.com HORIBAGROUP Excitation is from a powerful 450 W xenon lampcoupled toadouble gratingfast scanningmonochromator. The double grating arrangementgreatly reduces stray light and as the gratings arekinematically mounted they can easily be changedby the user to maximize efficiency at the desiredwavelength. The sample chamber optics， like the rest of theFluoroLog-3@， consist only of mirrors which unlikelenses will maintain their efficiency and focusthroughout a wide wavelength range. The emission goes though a Triax 552 0.5) mspectrograph， which offers high resolution and canaccommodate a variety of different detectors suchas， photon counting PMT， CCD， ICCD， Ge diodeand InGaAs arrays. The Triax 522 is unique in thattwo array detectors (CCD and InGaAs) can beaccommodated simultaneously. Results PL and PLE spectra of a GaN sample at varioustemperatures. Specifications Source-450 W xenon lamp Excitation range -230 nm to 1000 nm Emission range -230 nm to 3000 nm "Need more information on these devices?Contact Us!" In France ： In the USA： Jobin Yvon S.A. 16-18，rue du Canal91165 Longjumeau cedexTel： +33 (0)1 64 54 13 00 Fax： +33 (0)1 69 09 93 19 Jobin Yvon Inc.3880 Park AvenueEdison， NJ 08820Tel：+1 732 494 8660Fax： +1 732 549 5157 Email： fluorescence@jyhoriba.fr Email： fluorescence@jyhoriba.com China： +86 106836 6542Germany： +49 89 46 23 17 0Italy ：+39 2 57 60 30 50Japan： +81 35667 7351U.K. ： +44 20820481 42 EMISSION·FLUORESCENCE·FORENSICS·GRATINGSGOEM·OPTIGAL SPECTROSCOPY·RAMAN·THIN FILM PL and PLE spectra of a GaN sample at various temperatures.