地质样品中Al元素检测方案(ICP-AES)

Ultra-fast determination of base metals in geochemical samples using the 5100 SVDV ICP-OES Introduction Traditionally， geological samples are analyzed using flame atomic absorption (FAAS) and/or radial ICP-OES with avertical torch. Achieving high sample throughput at a low cost per analysis for geochemical samples can bechallenging when using these techniques. The samples often have a wide range of element concentrations，requiring multiple dilutions， particularly when using FAAS. The samples also have high levels of total dissolvedsolids (TDS)， which requires frequent cleaning of the sample introduction system. In this application note， theAgilent 5100 Synchronous Vertical Dual View (SVDV) ICP-OES was used to analyze geochemical samples containingup to 2.5% TDS. As well as demonstrating the accuracy and flexibility of the instrument， the sample measurementrate and argon consumption per sample were determined. Agilent Technologies