布鲁克 ESPRIT 四合一分析软件
布鲁克 ESPRIT 四合一分析软件
布鲁克 ESPRIT 四合一分析软件
布鲁克 ESPRIT 四合一分析软件
布鲁克 ESPRIT 四合一分析软件
布鲁克 ESPRIT 四合一分析软件
布鲁克 ESPRIT 四合一分析软件
布鲁克 ESPRIT 四合一分析软件
布鲁克 ESPRIT 四合一分析软件
布鲁克 ESPRIT 四合一分析软件

¥20万 - 50万

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ESPRIT

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欧洲

  • 金牌
  • 第7年
  • 一般经销商
  • 营业执照已审核
核心参数

产地类别: 进口

ESPRIT 2 将四种分析方法结合在单个用户界面下。其中包括用于SEM和(S)TEM的EDS、WDS、用于SEM的微区XRF和EBSD。这样,用户只需单击鼠标即可轻松在不同方法之间切换。此外,它便于将来自同一样本区域的不同方法采集的结果相结合,从而让用户获得更多信息。ESPRIT 软件支持多种方法的组合,以下只给出最重要的几个:

  • EDS 和 EBSD

  • EDS 和 WDS

  • SEM 的 EDS 和微区 XRF

软件被设计满足所有级别的用户- 从初学者到专家的需求。新手将受益于帮助执行日常任务的助手,而无需学习测量方法的详细信息。更有经验的用户可以在他们需要时深入钻取的软件更复杂的选项,这意味着测试参数可以深度设置,结果可以深入分析,测试任务也可以自动化完成。


  • Non-destructive sample analysis with high spatial resolution can be very difficult to accomplish using conventional EDS detectors as sample surface charging, electron beam damage and shading effects by topography are common problems in scanning electron microscopy. The BRUKER XFlash® FlatQUAD silicon drift detector (SDD) overcomes these limitations. The special geometry with an annular arrangement of detector elements offers a very high solid angle [1]. The XFlash® FlatQUAD detector allows the use of ultra-low beam currents and the investigation of samples with complex topography as demonstrated on two meteorite fall samples.

    地矿 2021-09-02

  • In the last decade, the EBSD technique has evolved - thanks to its combination with EDS - from being a tool for texture quantification to a complete microstructure characterization method. It is now more systematically used for quantifying grain size, phase distribution, grain boundary analysis and phase identification. EBSD analysis has become a standard analytical tool in Earth Sciences.

    地矿 2021-09-02

  • The evolution of texture and microstructure during plastic deformation controls the bulk mechanical properties of virtually all materials used to manufacture engineering components and equipment. SEM based in-situ tensile/ compression testing allows investigating the onset of plastic deformation as well as all intermediate deformation stages. Microstructure and texture evolution can be quantified when combining this technique with EBSD. The quantitative results can then be used for refining the plastic deformation theory as well as for confirming the existing simulation models.

    钢铁/金属 2021-09-02

  • Commercially available high speed steel was analyzed simultaneously using the EBSD and EDS techniques at a very high speed of more than 200 points/s. Thanks to its extremely fast reanalysis option the CrystAlign™ software permits the user to launch measurements without knowing all the phases present in the sample. This in turn significantly reduces the preparation time needed before launching the measurement. Thanks to these new hardware and software developments the SEM occupation time for acquiring a map of 480,000 points was drastically reduced to less than one hour i.e. 38 min for data acquisition, plus maximum 15 min for sample, electron beam, hardware and software setup.

    钢铁/金属 2021-09-02

  • The evolution of texture and microstructure during plastic deformation controls the bulk mechanical properties of virtually all materials used to manufacture engineering components and equipment. SEM based in-situ tensile/ compression testing allows investigating the onset of plastic deformation as well as all intermediate deformation stages. Microstructure and texture evolution can be quantified when combining this technique with EBSD. The quantitative results can then be used for refining the plastic deformation theory as well as for confirming the existing simulation models.

    钢铁/金属 2021-09-02

  • Commercially available high speed steel was analyzed simultaneously using the EBSD and EDS techniques at a very high speed of more than 200 points/s. Thanks to its extremely fast reanalysis option the CrystAlign™ software permits the user to launch measurements without knowing all the phases present in the sample. This in turn significantly reduces the preparation time needed before launching the measurement. Thanks to these new hardware and software developments the SEM occupation time for acquiring a map of 480,000 points was drastically reduced to less than one hour i.e. 38 min for data acquisition, plus maximum 15 min for sample, electron beam, hardware and software setup.

    钢铁/金属 2021-09-02

  • Quantitative analysis of a bulk sample requires that the composition of the sample is homogeneous over the analyzed volume. For inhomogenous samples the calculation of the matrix effects is not correct and this can lead to wrong results in the element concentrations. For samples containing a layer structure a different quantitative evaluation has to be applied. This can be provided with the standard-based analysis in ESPRIT in combination with the STRATAGem software.

    钢铁/金属 2021-09-02

  • Non-destructive sample analysis with high spatial resolution can be very difficult to accomplish using conventional EDS detectors as sample surface charging, electron beam damage and shading effects by topography are common problems in scanning electron microscopy. The BRUKER XFlash® FlatQUAD silicon drift detector (SDD) overcomes these limitations. The special geometry with an annular arrangement of detector elements offers a very high solid angle [1]. The XFlash® FlatQUAD detector allows the use of ultra-low beam currents and the investigation of samples with complex topography as demonstrated on two meteorite fall samples.

    地矿 2021-09-02

  • In the last decade, the EBSD technique has evolved - thanks to its combination with EDS - from being a tool for texture quantification to a complete microstructure characterization method. It is now more systematically used for quantifying grain size, phase distribution, grain boundary analysis and phase identification. EBSD analysis has become a standard analytical tool in Earth Sciences.

    地矿 2021-09-02

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