第二届SPM纳米科学中国论坛（NSSC 2020）_网络讲堂

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会议时间：12月10日 15:00 -- 12月10日 23:00

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大会介绍

The 2nd NSSC(NSSC 2020) will be held online on December 10th, NSSC 2020 will focus on electrical studies of advanced electronic devices (e.g. memristors, field effect transistors, sensors) by Scanning Probe Microscopy (SPM), including Conductive Atomic Force Microscopy (CAFM), Kelvin Probe Force Microscopy (KPFM), Scanning Thermal Probe Microscopy(SThM), among others. This symposium will also cover the progress of advanced SPM technology with extended capability, for example, scalpel AFM, multiprobe SPM, atomic switch. Renowned researchers in the field of materials science and electrical engineering will be invited and share their advanced knowledge about SPM related technologies.

NSSC is an open AFM user symposium focusing on sharing and exchanging the cutting-edge research for advanced electronic devices and materials using atomic force microscopy(AFM).

All keynote and contributed talks will be given online live, followed by moderated live chat rooms for Q&A and live discussion.

General Chair：Prof. Mario Lanza, King Abdullah University of Science and Technology.

Co-general Chair：Dr. Fei Hui, Technion-Israel Institute of Technology.

第二届SPM纳米科学中国论坛（NSSC 2020）将于12月10日线上举行，NSSC 2020将聚焦探讨扫描探针显微镜（SPM）技术与在先进电子设备（如忆阻器，场效应晶体管，传感器等）的电学等相关领域的研究及应用，具体包括导电原子力显微镜（CAFM），开尔文探针力显微镜（KPFM），热扫描探针显微镜（SThM）等。研讨会还将涵盖具有扩展功能的高级SPM技术的进展，例如手术刀AFM，多探头SPM，原子开关等。会议将邀请材料科学和电子工程领域的知名研究专家，在线分享他们在SPM相关技术方面的先进知识。

NSSC是一年一度的公开的AFM用户研讨会，致力于共享和交流AFM技术与先进电子器件和材料的前沿研究。

NSSC 2020所有演讲内容都将在网上进行实时直播，在直播室，主持人将与在线听众实时沟通、答疑和现场讨论。

会议主席：Mario Lanza教授，阿卜杜拉国王科技大学

会议联合主席：惠飞博士，以色列理工学院

直播互动：直播过程中将设置三轮抽奖环节，抽奖礼品总价值3000元人民币，欢迎参与！

主办单位：King Abdullah University of Science and Technology; Technion-Israel Institute of Technology; NanoScience杂志; Park原子力显微镜

协办单位：仪器信息网

会议日程

我要参会 12月10日第二届SPM纳米科学中国论坛（NSSC 2020）

15:00--15:05 Welcome speech
欢迎致辞 Mario Lanza King Abdullah University of Science and Technology, Saudi Arabia. General Chair
15:05--15:10 Welcome speech,
欢迎致辞 Keibock Lee Park Systems, Korea. Vice President & Chief Editor of NanoScientific
15:10--19:00 Session I Host: Fei Hui
15:10--15:40 看回放 Special Guest Interview：Inventor of Conductive Atomic Force Microscopy
特邀嘉宾视频专访:导电原子力显微镜发明人 Sean Joseph O’Shea A*STAR, Singapore. Principle Scientist
15:40--16:10 看回放 Invited talk: Recent Trends in Characterization of Nanoelectronic Materials and Devices with Scanning Probe Microscopy
特邀报告：使用扫描探针显微镜表征纳米电子材料和器件的最新趋势 Günther Benstetter Deggendorf Institute of Technology, Germany. Professor
16:10--16:40 Invited talk: Electrical AFM for Nanoelectronics
特邀报告：电子原子力显微镜纳米电子学研究 Umberto Celano IMEC, Belgium. Senior Scientist
16:40--17:10 看回放 Invited talk:Introduction of Recent SPM Hybrid Technology Development
特邀报告：扫描探针显微镜融合技术开发最新进展 Sangjoon Cho Park Systems, Korea. Vice President
17:10--17:40 看回放 Invited talk: Nanoscale Thermal Mapping of Electronic Devices
特邀报告：电子器件的纳米尺度热成像 Miguel Munoz Rojo University of Twente, Netherlands. Tenure Track Assistant Professor
17:40--19:00 Dinner time
晚餐时间 Individual dinner at your own place and reconnect
19:40--21:40 Session II Host: Mario Lanza
19:00--19:30 看回放 Keynote talk: Conductive Atomic Force Microscopy of 2D Materials and Heterostructures for Nanoelectronics
主题报告：导电原子力显微镜及纳米电子学二维材料和异质结构研究 Filippo Giannazzo National Research Council of Italy, Italy. Research Director
19:30--20:00 看回放 Invited talk: Conduction Atomic Force Microscopy for Gate Dielectric Reliability Analysis
特邀报告：用于栅极介电可靠性分析的导电原子力显微镜 Alok Ranjan Singapore University of Technology and Design, Singapore. Postdoctoral Research Fellow
20:00--20:30 看回放 Invited talk: Calcium Fluoride: an Outstanding High-k Dielectric for 2D Electronics
特邀报告：氟化钙:一种优秀的二维电子学高介电介质 Chao Wen Soochow University, China. (2020 Park AFM Scholarship Winner)
20:30--21:00 看回放 Park live demo: A Comparative Study for Surface Potential Mapping Using KPFM
Park原子力显微镜现场演示：使用KPFM进行表面电势映射的比较研究 Charles Kim Park Systems, Korea. AFM Application Specialist
21:00--21:30 看回放 Round-table discussion
圆桌论坛
Question 1: How do you rate the importance of Scanning Probe Microscopy for the benefit of nanosciences?
Question 2: What are the main SPM challenges that you are currently facing in your daily research?
Question 3: Which SPM-related setups and/or inventions would you like that SPM manufactures develop in the next years? Moderator: Mario Lanza; Panelist: Umberto Celano, Filippo Giannazzo, Miguel Munoz Rojo, Sang-joon Cho
21:30--21:40 Closing remarks
闭幕词 Host: Mario Lanza