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University of Twente, Netherlands.--Miguel Munoz Rojo

Miguel Munoz Rojo
Miguel Munoz Rojo Tenure Track Assistant Professor

University of Twente, Netherlands.

【个人简介】

Miguel Muñoz Rojo received his PhD (2015) in Condensed Matter Physics & Nanotechnology from the Spanish National Research Council (CSIC) and M.S./B.S. in Physics from the Autonomous University of Madrid. He obtained a JAE pre-doctoral Fellowship from CSIC to study during his PhD how the reduction of dimensionality affects the transport properties of organic and inorganic thermoelectric materials. During this period of time, he carried out scientific stays at the Rensselaer Polytechnic Institute (New York, USA), the University of Bordeaux (France) and the University of California Berkeley (USA). In 2012, he participated in the 62nd Lindau Nobel Laureate Meeting in Physics after qualifying in an international competition among young talent scientists. From 2016 to 2018, he became a postdoctoral researcher at Stanford University, studying two dimensional (2D) materials and devices based on them for thermal, electrical, and thermoelectric applications. In 2018 he became a Tenure Track Assistant Professor at Twente University. His line of research focuses on thermal management, energy harvesting, nano- and micro-scale thermometry and thermal sensing. For current research activities, please visit his group page: Advanced Materials for Energy Applications and Thermal Management.


精彩报告

2020-12-10 第二届SPM纳米科学中国论坛 (NSSC 2020)
报告:Invited talk: Nanoscale Thermal Mapping of Electronic Devices<br>特邀报告:电子器件的纳米尺度热成像 报名占位
【摘要】 One of the greatest challenges of modern society is related to energy consumption, dissipation and waste. A prominent example is that of integrated electronics, where power dissipation issues have become one of its greatest challenges. In this talk, I will discuss how to characterize energy dissipation in electronics, like heating in transistors based on 2D materials or in the conductive filaments of resistive random-access memories (RRAM), using spatially resolved thermometry. As the size of materials and devices shrinks to nanometer, atomic, or even quantum scale, it is more challenging to characterize their thermal properties reliably. Scanning thermal microscopy (SThM) is an emerging method to obtain local thermal information of electronic devices by controlling and monitoring probe–sample thermal exchange processes. Gaining thermal insights of our electronics is essential to design energy efficient circuits and understand and optimize ultra-dense data storage.

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