首页 网络讲堂 推荐专家 Sangjoon Cho

Park Systems, Korea,--Sangjoon Cho

Sangjoon Cho
Sangjoon Cho Vice President

Park Systems, Korea,

【个人简介】

Sang-Joon Cho, Ph.D. is a director in R&D Application Technology Center of 58 (23 in Korea, 25 in Abroad) Scientist and Engineers and VP. of Sales at Park Systems Corp. He is in charge of application development, demonstration, and technical writing. Previously, he was also a director in R&D of 30 people at Park for 12 years (Since 2005).

 His work over 20 years has built on diverse expertise in basic biomedical science and instrumentation and application development of SPM for Nano-metrology specially for media and semiconductor industry and Biomedical Science. He has been recognized with various awards and nationally fund research grants.

 In 2020, he is directors of two national grants developing optical hybrid AFM technologies.

 EDUCATION

Iowa State University Ph.D. in Neuroscience, 1998

 PROFESSIONAL Position

• Current, Park Systems Corp., Vice President & Director, R&D Application Tech Center

• Current, Advanced Institute of Convergence Technology, Seoul National Univ., Principal Researcher

• Current, ISO TC201 SC9 Scanning Probe Microscopy Chairman

• Current, Korea Analytical and Scientific Instruments Association (KASIA) BOD Member, & Head of operation

• Dec 2003 – Sept 2005, KAIST - Research Professor, Jung Mun Sul Center

• Oct 2000 – Aug 2003, Wayne State Univ. - Research Fellow, Dept. of Physiology, NanoBioTechnology Center, Assoc. Director (02~03)

 


精彩报告

2020-12-10 第二届SPM纳米科学中国论坛 (NSSC 2020)
报告:Invited talk: Non-contact AFM with Self-Optimizing and Pinpoint Scan Control for Quantitative Nano-Metrology<br>特邀报告:具有自优化和精确扫描控制的非接触式原子力显微镜及定量纳米测量 报名占位
【摘要】 Over the past three decades, AFM (Atomic Force Microscopy) has evolved into an ideal methodology for non-destructive sample scan with longer tip life, higher accuracy, repeatability, and automation. AFM is improving steadily so that it can be widely adopted like other microscopes, such as optics and scanning electron microscopes (SEM). In addition to the recent advances in AFM technology, it further expands the AFM application area by combining with other metrological technologies such as white interferometer (WLI) and photo-induced force microscopy (PiFM). By utilizing the vibration-isolated platform and the low noise z scanner of AFM, the performance of WLI has been greatly improved achieving unprecedented high z resolution.

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