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电镜专用自动清洁度分析系统---牛津仪器AZtecFeature
电镜专用自动清洁度分析系统---牛津仪器AZtecFeature

电镜专用自动清洁度分析系统---牛津仪器AZtecFeature

入门级扫描电镜

¥20万 - 30万

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AZtecFeature

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欧洲

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牛津仪器科技（上海）有限公司
  • 白金
  • 第23年
  • 一般经销商
    • 营业执照已审核
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核心参数

仪器种类： 台式/桌面型

电子枪种类： 钨灯丝

产地类别： 进口

二次电子图象分辨率： 1.0nm（15kV.WD=4mm)

放大倍数： 低：20-2,000x 高：100-500000x

加速电压： 1-30KV

背散射电子图像分辨率： 4nm@30kV（低真空模式）

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看了扫描电镜（SEM）的用户又看了

产品介绍 相关方案 售后服务承诺 用户评论 问商家

设备简介：

AZtecFeature是一种自动颗粒物分析系统，专门针对适用性和高速输出进行了优化。它结合了Ultim Max硅漂移探测器的高效性、灵敏性和Aztec优异的分析性能和简便操作，创造了先进的全自动颗粒物分析平台。

  • 快速且强大

  • 准确

  • 操作简单

设备概述：


快速且强大

  • 发挥新一代大面积Ultim Max SDD的潜力 - 在计数率低时实现高灵敏度，在计数率高时提供实现高效率

选择满足预算和测试需求的探测器

  • 最多可装配4个探测器，以提供尽可能高的效率和灵敏度，并消除粗糙样品上的颗粒阴影

  • AZtec具有64位处理器，真正具有多任务处理能力

  • 一个样品上至多可表征200,000个颗粒

  • 实时检测，形貌和元素分析

  • 在线或离线采集颗粒元素和相分析

  • 采集数据同时进行分析和输出报告

准确

  • AZtecFeature采用Tru-Q技术，无需用户干预即可提供自动的元素识别和定量分析，使其成为理想的自动数据采集系统

  • 改善的和峰修正可确保即使在高计数率下也能进行准确的定量分析

操作简单

  • 即使对于新样品，也可以在几秒钟内获得结果——无需费力的设置程序

  • 自动获得形貌和成分信息，并且易于匹配到颗粒分类中

  • 完整的系统设置可以存储于用户账户中，并在以后调用


AZtecFeature在不同的专业领域有不同的应用：

1． 刑侦领域：AZtecGSR枪击残留物分析

AZtecGSR能在SEM中快速而准确地进行枪击残留物分析：它为 ASTM E1588 - 10e1  提供了可重复的枪击残留物分析结果。AZtecGSR结合了通过引导流程实现的易用性和使用Ultim Max探测器和 Tru-Q® 算法实现的高精度。

2．钢铁产业：AZtecSteel钢铁夹杂物分析

AZtecSteel是一种自动化的钢铁夹杂物分析软件包，利用扫描电子显微镜(SEM)中的能谱分析(EDS)，专用于钢铁夹杂物的分析和分类，使SEM中的钢铁夹杂物分析变得更有效、更准确。它检测、测量并分析夹杂物，将数据结果按照公布的标准方法进行处理，并包含绘制复杂三元相图的功能。

3．矿物分析：AZtecMineral矿物分析软件

AZtecMineral是功能强大的自动化矿物解离分析解决方案。它利用多功能的扫描电镜进行矿物表征，并且为金属回收以及矿物产率的表征提供重要数据。同时，它是进行岩石表征的重要工具，可以代替耗时的光学显微镜分析。AZtecMineral可配备单个或多至四个牛津仪器大面积SDD能谱仪(Ultim Max)，效率更高，在快速采集的同时进行准确矿物分类，以及其他多种功能分析。

4．增材制造：AZtecAM增材制造分析

AZtecAM是一个功能强大、自动化程度高的检测系统，专门用于分析增材制造（3D打印）中使用的金属原材料粉末。它在AZtecFeature平台的基础上优化了颗粒分析流程，以实现金属粉末的快速准确表征。AZtecAM自动检测和识别原材料粉末中杂质颗粒、记录粉末颗粒形貌特征，也可深入研究单个颗粒，提供从形貌到成分、单个到统计的所有信息，是确保完善的增材制造工艺和高品质产品的理想工具。

5．制造业清洁度分析：AZtecClean清洁度分析

AZtecClean是一个功能强大的自动化清洁度分析系统，专门用于制造业的清洁度控制。它利用AZtecFeature平台，自动实现对颗粒物的分析统计，快速表征制造工艺过程的杂质颗粒，控制清洁度。在汽车制造及供应链品质控制，航空制造业，发动机制造，锂电池原材料纯净度控制等领域有很强的应用，帮助提高制造工艺和品质。


相关方案

综合能源/新能源地矿半导体钢铁/金属材料
  • 半导体中局部结构和元素组成检测方案(EBSD系统)
    Development and testing of semiconductor devices requires extensive knowledge of local structure and elemental composition. With feature sizes of <5 nm, it is often necessary to perform imaging and EDS analysis in a S / TEM. Once in the TEM, there are still many difficulties to be overcome to acquire accurate elemental maps. Elemental analysis of semiconductors is typically difficult due to strong overlaps of X-ray lines between commonly used elements and low concentrations of dopants. Not only are concentrations of dopants small but their X-ray lines often overlap with other materials used in semiconductor processing. This brief shows how AZtecTEM solves these overlaps to achieve an accurate elemental analysis. TEM Semiconductor Mapping in the TEM Solving peak overlaps in real-time Application Brief

    半导体 2018-01-08

  • 矿物中解离度检测方案(扫描电镜)
    Mineral liberation is a critical stage in the production of high quality mineralogical concentrates from their ores. The products (concentrates) must be of a suitable degree of purity for the downstream processes in which they will be used. The original mined ore must be processed via comminution (crushing, grinding and classification) to liberate the desired minerals from it and via concentration (froth flotation, gravity separation, magnetic separation) to enrich the mineral content to the desired level. In order to design, diagnose, monitor and optimise the process, information is needed on the extent to which the valuable mineral grains have been released from the accompanying gangue minerals (degree of liberation) and to which form they are lost in tailings (deportment studies).

    地矿 2018-01-08

  • 太阳能电池中微观结构和成分属性检测方案(EBSD系统)
    An important part of the research and development of thin-film solar cells is the characterisation of microstructural and compositional properties of the functional layers. For this purpose, energy-dispersive X-ray spectrometry (EDS) and electron backscatter diffraction (EBSD) represent techniques which exhibit spatial resolutions on the nanometer scale but can be, at the same time, applied on large areas of several square millimeters. The application of EDS and EBSD is demonstrated on this example of thin-film solar cells with Cu(In,Ga)Se2 absorber layers. While EDS provides elemental distributions even in layers with a nominal thickness of 30-50 nm, EBSD gives not only information of average grain sizes, local orientations and grain boundaries. Moreover, strain distributions within individual grains can be calculated by the evaluation of EBSD patterns recorded on individual grains.

    能源/新能源 2018-01-08

  • 金属材料中微观结构检测方案(其它元素分析仪)
    Abstract. This study investigates the changes in radial micro-texture via Kearn’s f-factors during single cold pilger reduction of a titanium Ti-3-2.5 alloy as a result of strain path changes from tooling modifications. EBSD results confirm that the texture intensity as well as the radial f-factors can be increased by modifications of pilgering tooling. In addition a switch between the secondary prism planes which lie normal to the pilger direction in the starting tube to primary prism planes after pilgering has been observed. Material and Experimental The tubes investigated were made from Ti alloy 3Al 2.5V, they were manufactured via hot extrusion and then cold pilgered. The cold pilger process configuration is schematically shown in Figure 1. Two strain paths, shown in the ‘Q‘ factor chart in Figure 2, were used in the manufactiure: texture minimised and texture maximised. They were annealed at 750oC before being cold pilgered and for this investigation they were stress relieved at 530oC for 2 hours prior to EBSD examination. Specimens were extracted from two regions either side of the reduced tube as shown in the schematic Figure 2, mounted in conductive Bakelite and polished mechanically for EBSD examination. The final polish was carried out using vibratory polishes using a mixture of 5:2 colloidal silica, hydrogen peroxide mixture. EBSD examination was conducted using a FEGSEM and OI EBSD Nordlys detector and AZtec Software.

    钢铁/金属 2018-01-08

  • 太阳能电池中微观结构和成分属性检测方案(EBSD系统)
    An important part of the research and development of thin-film solar cells is the characterisation of microstructural and compositional properties of the functional layers. For this purpose, energy-dispersive X-ray spectrometry (EDS) and electron backscatter diffraction (EBSD) represent techniques which exhibit spatial resolutions on the nanometer scale but can be, at the same time, applied on large areas of several square millimeters. The application of EDS and EBSD is demonstrated on this example of thin-film solar cells with Cu(In,Ga)Se2 absorber layers. While EDS provides elemental distributions even in layers with a nominal thickness of 30-50 nm, EBSD gives not only information of average grain sizes, local orientations and grain boundaries. Moreover, strain distributions within individual grains can be calculated by the evaluation of EBSD patterns recorded on individual grains.

    能源/新能源 2018-01-08

  • 锂电池中杂质分析检测方案(扫描电镜)
    Summary Impurities and contaminants in the material used in the production of Li-ion batteries can have catastrophic impacts on the finished products. As such, monitoring of the quality and cleanliness of materials throughout the production process is essential if contaminants are to be found and their sources controlled. This monitoring must start with the raw materials produced at the mine and continue through to the final battery grade powders. This application note demonstrates a scanning electron microscopy (SEM) based solution for automatic detection and identification of impurities in battery raw material powders. By taking samples at different steps of the production process it is possible to identify where contaminants are introduced; thereby allowing sources to be identified and solutions developed.

    能源/新能源 2020-06-15

  • 矿物中解离度检测方案(扫描电镜)
    Mineral liberation is a critical stage in the production of high quality mineralogical concentrates from their ores. The products (concentrates) must be of a suitable degree of purity for the downstream processes in which they will be used. The original mined ore must be processed via comminution (crushing, grinding and classification) to liberate the desired minerals from it and via concentration (froth flotation, gravity separation, magnetic separation) to enrich the mineral content to the desired level. In order to design, diagnose, monitor and optimise the process, information is needed on the extent to which the valuable mineral grains have been released from the accompanying gangue minerals (degree of liberation) and to which form they are lost in tailings (deportment studies).

    地矿 2018-01-08

  • 岩芯中评估岩石储层潜力检测方案(CCD相机)
    A detailed measurement of porosity, connectivity and fluid content is fundamental to the evaluation of a rock’s reservoir potential.

    地矿 2019-07-31

  • 半导体中局部结构和元素组成检测方案(EBSD系统)
    Development and testing of semiconductor devices requires extensive knowledge of local structure and elemental composition. With feature sizes of <5 nm, it is often necessary to perform imaging and EDS analysis in a S / TEM. Once in the TEM, there are still many difficulties to be overcome to acquire accurate elemental maps. Elemental analysis of semiconductors is typically difficult due to strong overlaps of X-ray lines between commonly used elements and low concentrations of dopants. Not only are concentrations of dopants small but their X-ray lines often overlap with other materials used in semiconductor processing. This brief shows how AZtecTEM solves these overlaps to achieve an accurate elemental analysis. TEM Semiconductor Mapping in the TEM Solving peak overlaps in real-time Application Brief

    半导体 2018-01-08

  • 半导体中结构检测方案(EBSD系统)
    Introduction Application Note As semiconductor devices continue to decrease in size to improve performance and take advantage of advances in fabrication techniques, there is a need to analyse both their structure and chemistry at ever increasing resolution. Typically this requires the use of TEM for metrology and failure analysis. Using ultrahigh resolution FEG-SEM, low kV imaging and the new X-Max® Extreme EDS detector we demonstrate the ability to retain some of this high resolution analysis in the SEM. This allows for better targeting of resources and increased throughput of analysis.

    半导体 2018-01-08

  • 金属材料中微观结构检测方案(其它元素分析仪)
    Abstract. This study investigates the changes in radial micro-texture via Kearn’s f-factors during single cold pilger reduction of a titanium Ti-3-2.5 alloy as a result of strain path changes from tooling modifications. EBSD results confirm that the texture intensity as well as the radial f-factors can be increased by modifications of pilgering tooling. In addition a switch between the secondary prism planes which lie normal to the pilger direction in the starting tube to primary prism planes after pilgering has been observed. Material and Experimental The tubes investigated were made from Ti alloy 3Al 2.5V, they were manufactured via hot extrusion and then cold pilgered. The cold pilger process configuration is schematically shown in Figure 1. Two strain paths, shown in the ‘Q‘ factor chart in Figure 2, were used in the manufactiure: texture minimised and texture maximised. They were annealed at 750oC before being cold pilgered and for this investigation they were stress relieved at 530oC for 2 hours prior to EBSD examination. Specimens were extracted from two regions either side of the reduced tube as shown in the schematic Figure 2, mounted in conductive Bakelite and polished mechanically for EBSD examination. The final polish was carried out using vibratory polishes using a mixture of 5:2 colloidal silica, hydrogen peroxide mixture. EBSD examination was conducted using a FEGSEM and OI EBSD Nordlys detector and AZtec Software.

    钢铁/金属 2018-01-08

  • 材料、塑料、胶黏剂中机械及电学性能检测方案(扫描探针)
    For many materials, the truly important is how they perform and behave under the conditions that they are likely to be exposed to during their use-lifetime. This may be the application of stresses and strains in construction materials, the dielectric properties of ceramics or the corrosion resistance of materials as they are exposed to a variety of atmospheric conditions.

    钢铁/金属 2019-07-31

  • 纳米材料中生长和表征检测方案(低温恒温器)
    The growth and manufacture of nanomaterials and nanostructure is fundamentally different to traditional top down manufacturing. Nanowires and 2D materials such as Graphene, MoS2 and hBN are grown by a catalytic self-assembly process and can be used to enhance current devices and build new device architectures.

    材料 2019-07-31

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  • 牛津仪器AZtecFeature 样本

    AZtecFeature是一种自动颗粒物分析系统，专门针对适用性和高速输出进行了优化。它结合了Ultim Max硅漂移探测器的高效性、灵敏性和Aztec出色的分析性能和简便操作，创造了先进的全自动颗粒物分析平台。

    3164MB 2020-06-11
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电镜专用自动清洁度分析系统---牛津仪器AZtecFeature信息由牛津仪器科技（上海）有限公司为您提供，如您想了解更多关于电镜专用自动清洁度分析系统---牛津仪器AZtecFeature报价、型号、参数等信息，欢迎来电或留言咨询。
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手机版：电镜专用自动清洁度分析系统---牛津仪器AZtecFeature
牛津仪器科技（上海）有限公司
布鲁克电子显微纳米分析仪器部
大和电子科技株式会社

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