牛津仪器Azteclive能谱实时元素成像系统
牛津仪器Azteclive能谱实时元素成像系统

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Azteclive

--

欧洲

  • 白金
  • 第23年
  • 一般经销商
  • 营业执照已审核
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AZtecLive是一种变革性的EDS分析方法,可以改变用户在SEM中进行样品筛选的方式。它将实时电子图像与实时X射线元素成像结合起来,为客户提供了一种更为直观的与样品互动的新方式。

AZtecLive的硬件是强大的Ultim Max系列能谱,结合新一代的SDD探测器和Extreme的电子电路,提供了高性能的速度和灵敏度。

·实时元素成像

·通过Live Trace记录分析过的每一个位置,方便回溯感兴趣的元素及位置

·最大170mm2探测器

·定量分析最大计数率达到400kcps

·面分布图最大计数率达到1000kcps


电镜样品制备必选耗材:

 AGG3939,双面碳导电胶带8mm×20m                         AGB7341,全自动型离子溅射仪

image.png          112.jpg

 



AGB7367A,全自动型高性能喷碳仪          51-OIQCTA,SEM及能谱多功能标样8mm×32mm

113.jpg      114.png

Zeiss蔡司扫描电镜SEM专用全套耗材包                                          硅片衬底

115.jpg           116.jpg



  • Mineral liberation is a critical stage in the production of high quality mineralogical concentrates from their ores. The products (concentrates) must be of a suitable degree of purity for the downstream processes in which they will be used. The original mined ore must be processed via comminution (crushing, grinding and classification) to liberate the desired minerals from it and via concentration (froth flotation, gravity separation, magnetic separation) to enrich the mineral content to the desired level. In order to design, diagnose, monitor and optimise the process, information is needed on the extent to which the valuable mineral grains have been released from the accompanying gangue minerals (degree of liberation) and to which form they are lost in tailings (deportment studies).

    地矿 2018-01-08

  • An important part of the research and development of thin-film solar cells is the characterisation of microstructural and compositional properties of the functional layers. For this purpose, energy-dispersive X-ray spectrometry (EDS) and electron backscatter diffraction (EBSD) represent techniques which exhibit spatial resolutions on the nanometer scale but can be, at the same time, applied on large areas of several square millimeters. The application of EDS and EBSD is demonstrated on this example of thin-film solar cells with Cu(In,Ga)Se2 absorber layers. While EDS provides elemental distributions even in layers with a nominal thickness of 30-50 nm, EBSD gives not only information of average grain sizes, local orientations and grain boundaries. Moreover, strain distributions within individual grains can be calculated by the evaluation of EBSD patterns recorded on individual grains.

    能源/新能源 2018-01-08

  • Abstract. This study investigates the changes in radial micro-texture via Kearn’s f-factors during single cold pilger reduction of a titanium Ti-3-2.5 alloy as a result of strain path changes from tooling modifications. EBSD results confirm that the texture intensity as well as the radial f-factors can be increased by modifications of pilgering tooling. In addition a switch between the secondary prism planes which lie normal to the pilger direction in the starting tube to primary prism planes after pilgering has been observed. Material and Experimental The tubes investigated were made from Ti alloy 3Al 2.5V, they were manufactured via hot extrusion and then cold pilgered. The cold pilger process configuration is schematically shown in Figure 1. Two strain paths, shown in the ‘Q‘ factor chart in Figure 2, were used in the manufactiure: texture minimised and texture maximised. They were annealed at 750oC before being cold pilgered and for this investigation they were stress relieved at 530oC for 2 hours prior to EBSD examination. Specimens were extracted from two regions either side of the reduced tube as shown in the schematic Figure 2, mounted in conductive Bakelite and polished mechanically for EBSD examination. The final polish was carried out using vibratory polishes using a mixture of 5:2 colloidal silica, hydrogen peroxide mixture. EBSD examination was conducted using a FEGSEM and OI EBSD Nordlys detector and AZtec Software.

    钢铁/金属 2018-01-08

  • Introduction Application Note As semiconductor devices continue to decrease in size to improve performance and take advantage of advances in fabrication techniques, there is a need to analyse both their structure and chemistry at ever increasing resolution. Typically this requires the use of TEM for metrology and failure analysis. Using ultrahigh resolution FEG-SEM, low kV imaging and the new X-Max® Extreme EDS detector we demonstrate the ability to retain some of this high resolution analysis in the SEM. This allows for better targeting of resources and increased throughput of analysis.

    半导体 2018-01-08

  • Mineral liberation is a critical stage in the production of high quality mineralogical concentrates from their ores. The products (concentrates) must be of a suitable degree of purity for the downstream processes in which they will be used. The original mined ore must be processed via comminution (crushing, grinding and classification) to liberate the desired minerals from it and via concentration (froth flotation, gravity separation, magnetic separation) to enrich the mineral content to the desired level. In order to design, diagnose, monitor and optimise the process, information is needed on the extent to which the valuable mineral grains have been released from the accompanying gangue minerals (degree of liberation) and to which form they are lost in tailings (deportment studies).

    地矿 2018-01-08

  • The economic viability of a mine can be determined by the microscopic characteristics of the ore, including the mineral abundance, the grain size and the degree of ore mineral liberation.

    地矿 2019-07-31

  • A detailed measurement of porosity, connectivity and fluid content is fundamental to the evaluation of a rock’s reservoir potential.

    地矿 2019-07-31

  • Abstract. This study investigates the changes in radial micro-texture via Kearn’s f-factors during single cold pilger reduction of a titanium Ti-3-2.5 alloy as a result of strain path changes from tooling modifications. EBSD results confirm that the texture intensity as well as the radial f-factors can be increased by modifications of pilgering tooling. In addition a switch between the secondary prism planes which lie normal to the pilger direction in the starting tube to primary prism planes after pilgering has been observed. Material and Experimental The tubes investigated were made from Ti alloy 3Al 2.5V, they were manufactured via hot extrusion and then cold pilgered. The cold pilger process configuration is schematically shown in Figure 1. Two strain paths, shown in the ‘Q‘ factor chart in Figure 2, were used in the manufactiure: texture minimised and texture maximised. They were annealed at 750oC before being cold pilgered and for this investigation they were stress relieved at 530oC for 2 hours prior to EBSD examination. Specimens were extracted from two regions either side of the reduced tube as shown in the schematic Figure 2, mounted in conductive Bakelite and polished mechanically for EBSD examination. The final polish was carried out using vibratory polishes using a mixture of 5:2 colloidal silica, hydrogen peroxide mixture. EBSD examination was conducted using a FEGSEM and OI EBSD Nordlys detector and AZtec Software.

    钢铁/金属 2018-01-08

  • For many materials, the truly important is how they perform and behave under the conditions that they are likely to be exposed to during their use-lifetime. This may be the application of stresses and strains in construction materials, the dielectric properties of ceramics or the corrosion resistance of materials as they are exposed to a variety of atmospheric conditions.

    钢铁/金属 2019-07-31

  • An important part of the research and development of thin-film solar cells is the characterisation of microstructural and compositional properties of the functional layers. For this purpose, energy-dispersive X-ray spectrometry (EDS) and electron backscatter diffraction (EBSD) represent techniques which exhibit spatial resolutions on the nanometer scale but can be, at the same time, applied on large areas of several square millimeters. The application of EDS and EBSD is demonstrated on this example of thin-film solar cells with Cu(In,Ga)Se2 absorber layers. While EDS provides elemental distributions even in layers with a nominal thickness of 30-50 nm, EBSD gives not only information of average grain sizes, local orientations and grain boundaries. Moreover, strain distributions within individual grains can be calculated by the evaluation of EBSD patterns recorded on individual grains.

    能源/新能源 2018-01-08

  • Introduction Application Note As semiconductor devices continue to decrease in size to improve performance and take advantage of advances in fabrication techniques, there is a need to analyse both their structure and chemistry at ever increasing resolution. Typically this requires the use of TEM for metrology and failure analysis. Using ultrahigh resolution FEG-SEM, low kV imaging and the new X-Max® Extreme EDS detector we demonstrate the ability to retain some of this high resolution analysis in the SEM. This allows for better targeting of resources and increased throughput of analysis.

    半导体 2018-01-08

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  • AZtecLive是一种变革性的EDS分析方法,可以改变用户在SEM中进行样品筛选的方式。它将实时电子图像与实时X射线元素成像结合起来,为客户提供了一种更为直观的与样品互动的新方式。

    829MB 2020-06-11
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