JASCO FTIR-4000傅立叶变换红外光谱仪
JASCO FTIR-4000傅立叶变换红外光谱仪

¥10万 - 15万

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FTIR-4000

--

亚洲

  • 银牌
  • 第9年
  • 一般经销商
  • 营业执照已审核
核心参数

仪器种类: 傅立叶变换型

仪器类型: 实验室型

产地类别: 进口

波数范围: 7800~350cm-1

分辨率: 0.4cm-1

扫描速度: 选项0Hz、16cm-1)

信噪比: 35000:1

日本分光 FTIR 概要

新型FT/IR-40006000系列、通过硬盘的最佳化以及高灵敏度、高安定和测量程序的更新,达到了操作性的提高。FTIR通过硬件和软件高水平融合大大的消减了测量所需的工夫和时间。硬件采用以往产品中积累的24A/D转换器低噪音电气系统的高灵敏度以及DSP技術的高准确度的移动镜控制、通过角隅棱镜可以提高安定性,在短时间内得到高品位的光谱。另外通过重组的测定程序进行即时数据处理功能、预扫描時可以设定最适合的测量以及解析条件、可消减测量后的数据处理的工夫和时间。

FT/IR-4000系列的特征

对应IQ附件
大型样品
免维护光学系
可以安装灵敏度检测器
标配自动验证功能


FT/IR-4600/4700

型号

4600

4700

测量波范围

                         7800~350cm-1

测量波数扩张范围*1

150002200cm-15000220cm-1

最高分辨率

0.7cm-1

0.4cm-1

S  N 

25000:1

35000:1

检测器

选项

DLATGS带温控

(MCT-NMCT-MMCT-WSi二极管InSbInGaAs)

分光器
选项

Ge/KBr
 (Si/CaF2
Ge/CsI)

光源
选项

光谱线陶瓷光源
 (
卤素灯)

干渉

45゜入射麦克尔逊干涉仪
使用角隅棱镜自动校准机构DSP控制密闭型

吹扫

干渉样品室检测器

快速扫描

选项0Hz、16cm-1)

主机

尺寸60W×645D×290Hmm(主机)

重量33kg(主机)

    *1FT/IR-4000系列的波数扩张为近红外远红外的其中之一



  • The IMV-4000 enables infrared imaging by a figure of two or more faster than using a conventional single element detector. A technique that quickly analyzes the results is also desirable. JASCO has proposed an analysis of imaging data with a variety of multivariate analysis techniques to accelerate the processing of infrared imaging data. For example, we have made it possible to easily create a visualization of the distribution map for the various components of multilayer film by analyzing imaging data using principle component analysis (PCA). We have also created a model that performs secondary structure estimation (SSE) on proteins based on IR spectra by principal components regression (PCR) and

    生物产业 2015-10-06

  • Figure 1: ATR-500/Mi?ATR crystal plate (Upper right: Prism and liquid cell) Characterized by wavelengths longer than the mid-infrared region, the far-infrared region is also referred to as the terahertz region. In recent years, this region has been used to evaluate crystal polymorphs for pharmaceuticals and semiconductor device materials, as well as for archaeological research applications, including the study of inorganic pigments. Light in the far-infrared region (terahertz waves) corresponds to hydrogen bonding and Van der Waals forces believed to hold the key to an understanding of the functional

    环保 2015-10-06

  • Introduction Near-Infrared (NIR) spectroscopy has unique capabilities as compared to mid-infrared analysis which can often require extensive sample preparation to obtain an identifiable spectrum. As such, NIR can be useful for the non-destructive analysis of a specific sample area or provide an average of a larger sample area, depending upon the required analysis. In recent years, NIR spectroscopy has been widely used for the examination of biological samples and quality control/analysis of food and medical products. The diffuse reflectance technique is ideal for this method due to extremely simple sample handling such that rapid identification of illegal drugs, such as MDMA, can be accomplished by using a search data library created using NIR diffuse reflectance.

    制药/生物制药 2015-10-06

  • FT/IR-4000, 6000 series?? IRT-5000/7000 system?? * O2/N2 concentration measurement inside of Si wafer * Hydrogen??terminated evaluation on Si wafers * Quantitative/ Qualitative measurement of highly polymerized compounds ?? * Dynamic analysis of liquid crystal materials ?? * Reflectance of solar radiation on glass?? * Gas phase analysis ??

    电子/电气 2015-10-06

  • The IMV-4000 enables infrared imaging by a figure of two or more faster than using a conventional single element detector. A technique that quickly analyzes the results is also desirable. JASCO has proposed an analysis of imaging data with a variety of multivariate analysis techniques to accelerate the processing of infrared imaging data. For example, we have made it possible to easily create a visualization of the distribution map for the various components of multilayer film by analyzing imaging data using principle component analysis (PCA). We have also created a model that performs secondary structure estimation (SSE) on proteins based on IR spectra by principal components regression (PCR) and

    生物产业 2015-10-06

  • 在本申请说明中,使用快速扫描测量了油和应用于ATR棱镜表面的表面活性剂之间的反应过程。

    生物产业 2023-06-30

  • 本应用说明提供了IRT-5000/7000系列FT/IR显微镜新开发的微成像分析程序中使用“MCR模型分析”进行成像数据分析的示例(如图2所示)。MCR模型分析是微成像分析程序中的一个辅助分析功能,它可以在不验证矩阵中每个光谱的情况下创建样本图像。关键词:FTIR,FTIR显微镜,FTIR成像化学成像,红外成像,主成分分析,IRT-5100,IRT-7100,IRT-7200杂质分析,聚酯,聚乙烯,蛋白质,聚氯乙烯,多元回归

    生物产业 2023-07-06

  • 本文研究了使用成像来研究氰基丙烯酸酯粘合剂固化过程中的反应过程。

    生物产业 2023-07-06

  • Figure 1: ATR-500/Mi?ATR crystal plate (Upper right: Prism and liquid cell) Characterized by wavelengths longer than the mid-infrared region, the far-infrared region is also referred to as the terahertz region. In recent years, this region has been used to evaluate crystal polymorphs for pharmaceuticals and semiconductor device materials, as well as for archaeological research applications, including the study of inorganic pigments. Light in the far-infrared region (terahertz waves) corresponds to hydrogen bonding and Van der Waals forces believed to hold the key to an understanding of the functional

    环保 2015-10-06

  • Gas Analysis System using Full Vacuum Type FT/IR (Trace amount of H2O in N2 gas) (1/2) No. 230TR0187-E The analysis of low concentration gases using long pathlength gas cells has been reported previously, however, it can be difficult to accurately quantitate gases at low concentrations when the absorption peaks of the target gas overlap with the peaks of atmospheric water vapor or, when the target gas itself is H2O or CO2, which are presnet in the atmosphere. This is because even with a vacuum FT-IR instrument, it was not possible to evacuate the sample chamber with the long pathlength cell present. The full vacuum gas analysis system introduced in this application note has a special gas cell integrated into the sample chamber, allowing the entire light path to remain under full vacuum with the gas cell in place. This full vacuum model makes it possible to quantitate concentrations of H2O even at the 0.1 ppm level. For the measurement, there are separate vacuum lines for evacuation of the FT-IR instrument and the gas cell, with independent evacuation capability for the separate components. Adding a vacuum gauge to the gas cell makes it possible to control extremely

    环保 2015-10-06

  • 本说明说明了使用FTIR评估同时检测温室气体。

    环保 2023-07-03

  • Introduction Near-Infrared (NIR) spectroscopy has unique capabilities as compared to mid-infrared analysis which can often require extensive sample preparation to obtain an identifiable spectrum. As such, NIR can be useful for the non-destructive analysis of a specific sample area or provide an average of a larger sample area, depending upon the required analysis. In recent years, NIR spectroscopy has been widely used for the examination of biological samples and quality control/analysis of food and medical products. The diffuse reflectance technique is ideal for this method due to extremely simple sample handling such that rapid identification of illegal drugs, such as MDMA, can be accomplished by using a search data library created using NIR diffuse reflectance.

    制药/生物制药 2015-10-06

  • The use of near-infrared (NIR) spectroscopy in the pharmaceutical industry has grown rapidly in the past decade. The IMV-4000 Infrared Multichannel Viewer integrated with a NIR capable FT/IR- 4000 or FT/IR-6000 instrument enables NIR Imaging of pharmaceutical tablets, a valuable tool in the estimation of tablet properties, offering measurement data with high specificity and sensitivity. The obtained data can be exported into the Principal Component Analysis (PCA) software for the estimation of tablet characteristics. Instrument: FTIR-6200 with IMV-4000 CaF2 beam splitter, NIR source, etc

    制药/生物制药 2015-10-06

  • JASCO IRT-5000/7000系列FT-IR显微镜系统能够将系统从基本的单元件探测器显微镜附件不断升级为多元件探测器成像系统。数据收集和分析软件包为从各种类型的样本中收集数据提供了广泛的选项,并提供了大量的样本数据可视化功能。显微镜可以添加到JASCO FT/IR-4000或FT/IR-6000系列仪器中,提供从最基本的仪器平台到研究级光谱仪的显微镜或成像能力。IRT-5000/7000有多种选择,可以根据用户的指定提供显微镜和/或成像,只提供购买时所需的物品,但可以随时升级以扩展显微镜系统的功能。

    制药/生物制药 2023-07-06

  • 在本应用说明中,我们想介绍几种测量选项,以最小化二氧化碳和水蒸气的影响,包括“Shuttle Measurement”和“Purge and Vacuum”。

    材料 2023-05-30

  • 聚合物存在于日常生活中。从我们吃的食物的包装到垃圾袋,聚合物几乎无处不在。汽车也不例外。聚合物占现代汽车的40%以上;地毯、座椅、衬垫、旋钮、开关、仪表板和化妆品覆盖物由一种或另一种聚合物组成。本文将描述汽车中各种聚合物的分析,以便立即进行研究。

    材料 2023-07-06

  • 在本应用说明中,使用ATR PRO ONE VIEW演示了几种纤维产品的测量。 关键词纤维,样本图像,材料分析,ATR Pro One视图,FT/IR-4000

    材料 2023-07-03

  • FT/IR-4000, 6000 series?? IRT-5000/7000 system?? * O2/N2 concentration measurement inside of Si wafer * Hydrogen??terminated evaluation on Si wafers * Quantitative/ Qualitative measurement of highly polymerized compounds ?? * Dynamic analysis of liquid crystal materials ?? * Reflectance of solar radiation on glass?? * Gas phase analysis ??

    电子/电气 2015-10-06

  • Analysis Example by Vacuum Model FT/IR (1) Measurement of Silicon Wafer (1/1) No. 220TR0164-E Due to the high refractive index of silicon wafer samples, there is a correspondingly high reflectance from the sample. If the sample is placed directly in the sample compartment, vertical to the incident source beam, the reflection of the source returns to the interferometer, is reflected by the beamsplitter and then illuminates the sample again. As a result, the sample pathlength of the sample measurement is different from the background measurement and excessive noise is observed due to the atmospheric water vapor, even with a purged instrument. While it is possible to adjust the angle of the sample with respect to the incident source illumination, using an evacuated FT-IR instrument allows measurement of the sample vertical to the incident illumination without

    电子/电气 2015-10-06

  • Analysis Example by Vacuum Model FT/IR (1) Measurement of Silicon Wafer (1/1) No. 220TR0164-E Due to the high refractive index of silicon wafer samples, there is a correspondingly high reflectance from the sample. If the sample is placed directly in the sample compartment, vertical to the incident source beam, the reflection of the source returns to the interferometer, is reflected by the beamsplitter and then illuminates the sample again. As a result, the sample pathlength of the sample measurement is different from the background measurement and excessive noise is observed due to the atmospheric water vapor, even with a purged instrument. While it is possible to adjust the angle of the sample with respect to the incident source illumination, using an evacuated FT-IR instrument allows measurement of the sample vertical to the incident illumination without

    电子/电气 2015-10-06

售后服务承诺

保修期: 1年

是否可延长保修期:

现场技术咨询:

免费培训: 免费培训用户处3人以上

免费仪器保养: 半年一次

保内维修承诺: 免费上门维修和更换零配件

报修承诺: 2小时响应,24小时内到现场维修

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