EDS在硅酸盐水泥中的应用

Using Bruker’s Hysitron PI 88 SEM PicoIndenter equipped with tilt and rotation stages in conjunction with the QUANTAX EBSD system enables a more robust characterization of metallic materials by combining high resolution phase and grain orientation mapping capabilities with targeted nanomechanical property measurements. This combination could also be used to extend the scope of research related to other advanced textured, anisotropic, or multi-phase materials.

In the last decade, the EBSD technique has evolved - thanks to its combination with EDS - from being a tool for texture quantification to a complete microstructure characterization method. It is now more systematically used for quantifying grain size, phase distribution, grain boundary analysis and phase identification. EBSD analysis has become a standard analytical tool in Earth Sciences.

The evolution of texture and microstructure during plastic deformation controls the bulk mechanical properties of virtually all materials used to manufacture engineering components and equipment. SEM based in-situ tensile/ compression testing allows investigating the onset of plastic deformation as well as all intermediate deformation stages. Microstructure and texture evolution can be quantified when combining this technique with EBSD. The quantitative results can then be used for refining the plastic deformation theory as well as for confirming the existing simulation models.

Commercially available high speed steel was analyzed simultaneously using the EBSD and EDS techniques at a very high speed of more than 200 points/s. Thanks to its extremely fast reanalysis option the CrystAlign™ software permits the user to launch measurements without knowing all the phases present in the sample. This in turn significantly reduces the preparation time needed before launching the measurement. Thanks to these new hardware and software developments the SEM occupation time for acquiring a map of 480,000 points was drastically reduced to less than one hour i.e. 38 min for data acquisition, plus maximum 15 min for sample, electron beam, hardware and software setup.