核心参数
产地类别: 进口
CCD相机分辨率: 640 x 480
极限速度: 最快移动速度可达 10mm/s
空间分辨率: 50 nm
角分辨率: 0.2°
QUANTAX ED-XS 是一款为紧凑型电镜设计的EBSD-EDS系统:
可搭配在紧凑型SEM和台式扫描电镜
用户可自行更换探头
经济实惠的服务合同选项
可实现EBSD和EDS数据同步采集
易于使用的 EBSD:无需校准并且用户可自行更换磷屏
安全操作:不使用时,e-Flash XS 与SEM 仓室内的其它仪器发生意外碰撞的可能性为0%
布鲁克EBSD系统QUANTAX ED-XS的工作原理介绍
EBSD系统QUANTAX ED-XS的使用方法?
布鲁克QUANTAX ED-XS多少钱一台?
EBSD系统QUANTAX ED-XS可以检测什么?
EBSD系统QUANTAX ED-XS使用的注意事项?
布鲁克QUANTAX ED-XS的说明书有吗?
布鲁克EBSD系统QUANTAX ED-XS的操作规程有吗?
布鲁克EBSD系统QUANTAX ED-XS报价含票含运吗?
布鲁克QUANTAX ED-XS有现货吗?
更多
原位压缩和拉伸变形材料的定向对比成像和EBSD分析
The evolution of texture and microstructure during plastic deformation controls the bulk mechanical properties of virtually all materials used to manufacture engineering components and equipment. SEM based in-situ tensile/ compression testing allows investigating the onset of plastic deformation as well as all intermediate deformation stages. Microstructure and texture evolution can be quantified when combining this technique with EBSD. The quantitative results can then be used for refining the plastic deformation theory as well as for confirming the existing simulation models.
钢铁/金属
2021/09/02
EBSD和EDS在高速钢中的应用
Commercially available high speed steel was analyzed simultaneously using the EBSD and EDS techniques at a very high speed of more than 200 points/s. Thanks to its extremely fast reanalysis option the CrystAlign™ software permits the user to launch measurements without knowing all the phases present in the sample. This in turn significantly reduces the preparation time needed before launching the measurement. Thanks to these new hardware and software developments the SEM occupation time for acquiring a map of 480,000 points was drastically reduced to less than one hour i.e. 38 min for data acquisition, plus maximum 15 min for sample, electron beam, hardware and software setup.
钢铁/金属
2021/09/02
企业名称
布鲁克(北京)科技有限公司
企业信息已认证
企业类型
信用代码
110000450210731
成立日期
2012-07-17
注册资本
400
经营范围
布鲁克北京
公司地址
北京海淀区中关村东升科技园B6号楼C座八层
客服电话