2021/09/02 16:57
阅读:113
分享:方案摘要:
产品配置单:
布鲁克 电子背散射衍射仪 EBSD
型号: QUANTAX ED-XS
产地: 德国
品牌: 布鲁克
¥40万 - 50万
参考报价
联系电话
布鲁克 ESPRIT 四合一分析软件
型号: ESPRIT
产地: 德国
品牌: 布鲁克
¥20万 - 50万
参考报价
联系电话
布鲁克扫描电镜专用原位纳米力学测试系统PI 88
型号: PI88
产地: 美国
品牌: 布鲁克
¥150万 - 200万
参考报价
联系电话
方案详情:
in-situ tensile and compression testing experiments in
combination with FSE imaging and EBSD analysis. The
very beginning of plastic deformation was easily identified
using FSE imaging, while orientation maps were acquired to
allow a proper quantification of the evolution of texture and
microstructure during the different stages of the deformation
process. The results have shown that the combination
of in-situ tensile testing with EBSD and orientation contrast
imaging can be successfully used to deepen our understanding
of the complex phenomena that take place during all
stages of plastic deformation in different types of materials.
下载本篇解决方案:
更多
双相不锈钢的增强纳米压痕应用
Using Bruker’s Hysitron PI 88 SEM PicoIndenter equipped with tilt and rotation stages in conjunction with the QUANTAX EBSD system enables a more robust characterization of metallic materials by combining high resolution phase and grain orientation mapping capabilities with targeted nanomechanical property measurements. This combination could also be used to extend the scope of research related to other advanced textured, anisotropic, or multi-phase materials.
钢铁/金属
2021/09/02
EBSD和EDS在矿物学样品的相识别和分布应用
In the last decade, the EBSD technique has evolved - thanks to its combination with EDS - from being a tool for texture quantification to a complete microstructure characterization method. It is now more systematically used for quantifying grain size, phase distribution, grain boundary analysis and phase identification. EBSD analysis has become a standard analytical tool in Earth Sciences.
地矿
2021/09/02
EBSD和EDS在高速钢中的应用
Commercially available high speed steel was analyzed simultaneously using the EBSD and EDS techniques at a very high speed of more than 200 points/s. Thanks to its extremely fast reanalysis option the CrystAlign™ software permits the user to launch measurements without knowing all the phases present in the sample. This in turn significantly reduces the preparation time needed before launching the measurement. Thanks to these new hardware and software developments the SEM occupation time for acquiring a map of 480,000 points was drastically reduced to less than one hour i.e. 38 min for data acquisition, plus maximum 15 min for sample, electron beam, hardware and software setup.
钢铁/金属
2021/09/02
EDS在陨石中的应用
Non-destructive sample analysis with high spatial resolution can be very difficult to accomplish using conventional EDS detectors as sample surface charging, electron beam damage and shading effects by topography are common problems in scanning electron microscopy. The BRUKER XFlash® FlatQUAD silicon drift detector (SDD) overcomes these limitations. The special geometry with an annular arrangement of detector elements offers a very high solid angle [1]. The XFlash® FlatQUAD detector allows the use of ultra-low beam currents and the investigation of samples with complex topography as demonstrated on two meteorite fall samples.
地矿
2021/09/02