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The majority of printing problems are primarily caused by clogged print heads or nozzles, preventing the ink from reaching the paper. Each year billions

The use of Raman spectroscopy for routine quantitative analysis is desirable due to the simple sample handling requirements for sample analysis. Due to the many variables associated with Raman spectroscopy, specifically,

Laminates are combinations of polymers that combine the benefits and properties of the various polymers used in the laminate to create a better material. Polymer laminates have a multitude of uses including packaging for food and other products. Laminates act as moisture and/or oxygen barriers and as such are commonly used to protect foods and chemicals. Analysis of laminates is often required for quality control and to determine laminate adhesion problems.

The liquid sample is one of the most common types of samples submitted for analysis and comprises a vast array of pure compounds and solutions. As an example, several liquids are used in an automobile to sustain critical elements such as lubricating the engine or drive train and to supply mundane functions like washing the windows or generating electrical power. This paper will describe the analysis of

Figure 1: ATR-500/Mi?ATR crystal plate (Upper right: Prism and liquid cell) Characterized by wavelengths longer than the mid-infrared region, the far-infrared region is also referred to as the terahertz region. In recent years, this region has been used to evaluate crystal polymorphs for pharmaceuticals and semiconductor device materials, as well as for archaeological research applications, including the study of inorganic pigments. Light in the far-infrared region (terahertz waves) corresponds to hydrogen bonding and Van der Waals forces believed to hold the key to an understanding of the functional

Gas Analysis System using Full Vacuum Type FT/IR (Trace amount of H2O in N2 gas) (1/2) No. 230TR0187-E The analysis of low concentration gases using long pathlength gas cells has been reported previously, however, it can be difficult to accurately quantitate gases at low concentrations when the absorption peaks of the target gas overlap with the peaks of atmospheric water vapor or, when the target gas itself is H2O or CO2, which are presnet in the atmosphere. This is because even with a vacuum FT-IR instrument, it was not possible to evacuate the sample chamber with the long pathlength cell present. The full vacuum gas analysis system introduced in this application note has a special gas cell integrated into the sample chamber, allowing the entire light path to remain under full vacuum with the gas cell in place. This full vacuum model makes it possible to quantitate concentrations of H2O even at the 0.1 ppm level. For the measurement, there are separate vacuum lines for evacuation of the FT-IR instrument and the gas cell, with independent evacuation capability for the separate components. Adding a vacuum gauge to the gas cell makes it possible to control extremely

Carbon nanotubes are unique nanostructures with remarkable electronic and mechanical properties. Nanotubes have been considered prototypes for a one-dimensional quantum wire. As other useful properties have been discovered, particularly strength, interest has grown in potential applications,

Introduction Near-Infrared (NIR) spectroscopy has unique capabilities as compared to mid-infrared analysis which can often require extensive sample preparation to obtain an identifiable spectrum. As such, NIR can be useful for the non-destructive analysis of a specific sample area or provide an average of a larger sample area, depending upon the required analysis. In recent years, NIR spectroscopy has been widely used for the examination of biological samples and quality control/analysis of food and medical products. The diffuse reflectance technique is ideal for this method due to extremely simple sample handling such that rapid identification of illegal drugs, such as MDMA, can be accomplished by using a search data library created using NIR diffuse reflectance.

The use of near-infrared (NIR) spectroscopy in the pharmaceutical industry has grown rapidly in the past decade. The IMV-4000 Infrared Multichannel Viewer integrated with a NIR capable FT/IR- 4000 or FT/IR-6000 instrument enables NIR Imaging of pharmaceutical tablets, a valuable tool in the estimation of tablet properties, offering measurement data with high specificity and sensitivity. The obtained data can be exported into the Principal Component Analysis (PCA) software for the estimation of tablet characteristics. Instrument: FTIR-6200 with IMV-4000 CaF2 beam splitter, NIR source, etc

The IMV-4000 enables infrared imaging by a figure of two or more faster than using a conventional single element detector. A technique that quickly analyzes the results is also desirable. JASCO has proposed an analysis of imaging data with a variety of multivariate analysis techniques to accelerate the processing of infrared imaging data. For example, we have made it possible to easily create a visualization of the distribution map for the various components of multilayer film by analyzing imaging data using principle component analysis (PCA). We have also created a model that performs secondary structure estimation (SSE) on proteins based on IR spectra by principal components regression (PCR) and

In recent years, the gemstone market has been flooded with stones of questionable origin. Frequently, even thorough analysis by a qualified jeweler cannot unequivocally reveal whether

Analysis Example by Vacuum Model FT/IR (1) Measurement of Silicon Wafer (1/1) No. 220TR0164-E Due to the high refractive index of silicon wafer samples, there is a correspondingly high reflectance from the sample. If the sample is placed directly in the sample compartment, vertical to the incident source beam, the reflection of the source returns to the interferometer, is reflected by the beamsplitter and then illuminates the sample again. As a result, the sample pathlength of the sample measurement is different from the background measurement and excessive noise is observed due to the atmospheric water vapor, even with a purged instrument. While it is possible to adjust the angle of the sample with respect to the incident source illumination, using an evacuated FT-IR instrument allows measurement of the sample vertical to the incident illumination without

FT/IR-4000, 6000 series?? IRT-5000/7000 system?? * O2/N2 concentration measurement inside of Si wafer * Hydrogen??terminated evaluation on Si wafers * Quantitative/ Qualitative measurement of highly polymerized compounds ?? * Dynamic analysis of liquid crystal materials ?? * Reflectance of solar radiation on glass?? * Gas phase analysis ??

Analysis Example by Vacuum Model FT/IR (1) Measurement of Silicon Wafer (1/1) No. 220TR0164-E Due to the high refractive index of silicon wafer samples, there is a correspondingly high reflectance from the sample. If the sample is placed directly in the sample compartment, vertical to the incident source beam, the reflection of the source returns to the interferometer, is reflected by the beamsplitter and then illuminates the sample again. As a result, the sample pathlength of the sample measurement is different from the background measurement and excessive noise is observed due to the atmospheric water vapor, even with a purged instrument. While it is possible to adjust the angle of the sample with respect to the incident source illumination, using an evacuated FT-IR instrument allows measurement of the sample vertical to the incident illumination without