采用UVISEL相调制型椭圆偏振光谱仪对chalcogenide glass样品进行分析，研究其相应光学性质。

采用UVISEL相调制型椭圆偏振光谱仪对Porous silicon composite material 样品进行分析，研究其相应光学性质。

采用UVISEL相调制型椭圆偏振光谱仪可以对PDP结构样品进行分析,得到结构中各层的厚度、折射率的变化.

采用UVISEL相调制型椭圆偏振光谱仪对DNA Sensor Pads样品进行分析,研究其膜层厚度和相应光学性质.

具体介绍了相位调制型椭偏仪与机械旋转椭偏仪的区别，应用的区别，优缺的对比，方便区分及具体的测试需要及使用。

采用UVISEL相调制型椭圆偏振光谱仪对TiO2 Thin Films and Multilayer Antireflective Coatings样品进行分析,研究其膜层厚度和相应光学性质。

采用UVISEL相调制型椭圆偏振光谱仪对ZrO2 Thin Films on Glass Substrates样品进行分析,研究其膜层厚度和相应光学性质。

Ellipsometry is a very versatile optical technique that has applications in many different fields, from the micro electronics and semiconductor industries (for characterizing oxides or photoresists on silicon wafers, for ex ample) to biology. This very sensitive measurement technique provides unequalled capabilities for thin film metrology, and has the advantage that it is non-destructive as it uses polarized light to probe the dielectr properties of a sample.

采用UVISEL相调制型椭圆偏振光谱仪对ZrO2 Thin Films on Glass Substrates样品进行分析,研究其膜层厚度和相应光学性质。