产地类别: 进口
看了null的用户又看了
Cross section and sample surface polishing ability combined in a single unit
The new Hitachi IM4000 Ar ion milling system makes two milling configurations available in a single instrument.
While previously two separate systems were needed to perform both, cross section cutting (E-3500) and wide-area sample surface fine polishing (IM3000), Hitachi's new IM4000 now allows to run both applications within the same machine.
Furthermore, the new Ar ion gun design of the IM4000 allows to reduce cross section processing times by as much as 66% compared to the previous E-3500 as the maximum milling rate has been increased to now 300µm/h for Si.
Also in the IM4000 the sample stage unit can be removed as a whole for convenient specimen setting and cross section cutting edge fine positioning using as external high-resolution optical microscope.
Cross Section Milling
Conventional mechanical polishing or cutting techniques on soft and composite materials apply significant lateral sheer forces to the sample and often result in cross section surface artefacts such as scratches, smearing, wash-out of softer materials, delamination and other damage.
In contrast, ion beam sputtering is a stress-free physical process whereby atoms are ejected from a target material due to bombardment of the target by energetic particles.
Mirror-surface quality cross sections are formed by placing an ion beam resistant mask in such way onto a sample surface that one half of the vertically incident ion beam is blocked by the mask. The other half of the ion beam gradually removes the sample material protruding from the mask, so that a straight cross sectional plain is formed below the edge of the protective mask.
The range of materials and samples applicable to ion cross section milling is not limited to hard matter; even "soft" samples such as paper, polymers, and even powders allow high-quality sectioning in the IM4000.
云必真空设备原位进样系统/真空转移盒/原位样品台MUST IN2
高分辨成像与光谱分析阴极发光成像系统Gatan Mono CL4
日本电子 JEOL 软X射线分光谱仪 SXES
赛默飞电镜惰性气体/真空保护样品传输系统CleanConnect™
【速普仪器】电镜腔体原位等离子清洗仪RPS50
NanoMEGAS 透射电镜旋进电子衍射和纳米晶体分析系统 DigiSTAR
上海荟尚仪器有限公司
适用金属和矿物研究—飞纳电镜ChemiPhase物相分析软件
复纳科学仪器(上海)有限公司
扫描电镜用超低温冷台——GSC MK系列
北京金竟科技有限责任公司
电子显微镜专用纳米机械手解决方案
上海微纳国际贸易有限公司
最多添加5台