核心参数
仪器种类: 原子力显微镜
产地类别: 进口
定位检测噪声: XY≤0.1, Z≤0.06
样品尺寸: 直径小于20mm, 高度小于10mm
样品台移动范围: 5mm*5mm
NT-MDT扫描探针Ntegra Spectra的工作原理介绍
扫描探针Ntegra Spectra的使用方法?
NT-MDTNtegra Spectra多少钱一台?
扫描探针Ntegra Spectra可以检测什么?
扫描探针Ntegra Spectra使用的注意事项?
NT-MDTNtegra Spectra的说明书有吗?
NT-MDT扫描探针Ntegra Spectra的操作规程有吗?
NT-MDT扫描探针Ntegra Spectra报价含票含运吗?
NT-MDTNtegra Spectra有现货吗?
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EC AFM
In-situ control/modification of the surface morphology of single crystal and polycrystal electrodes (samples) during electrochemical process (in situ) in electrolyte solutions together with STM (max resolution – atomic) and AFM.
1932KB
2019/07/02
18 Near-Fild Optical Lithography in Application to Plasmonic Antennas Characterization
18 Near-Fild Optical Lithography in Application to Plasmonic Antennas Characterization
606KB
2019/07/01
17 Phase-sensitive plasmonics biosensors_ from bulk to nanoscale architechtures
17 Phase-sensitive plasmonics biosensors_ from bulk to nanoscale architechtures and novel functionalities
1914KB
2019/07/01
16 Subwavelength Focusing of Laser Light Using Zone Plates with Silver and Chromium Rings
16 Subwavelength Focusing of Laser Light Using Zone Plates with Silver and Chromium Rings
365KB
2019/07/01
15 The tight focusing of laser radiation using 4-sector polarization converter
15 The tight focusing of laser radiation using 4-sector polarization converter
1370KB
2019/07/01
14PlasmonichierarchicalnanostructureswithcascadedfieldenhancementandtheirSERSapplications
14PlasmonichierarchicalnanostructureswithcascadedfieldenhancementandtheirSERSapplications
578KB
2019/07/01
13 Controlling phase separation in vanadium dioxide thin films via substrate engineering
13 Controlling phase separation in vanadium dioxide thin films via substrate engineering
2081KB
2019/07/01
12 Use of scanning near-field optical microscope for detection of luminescent nanodiamond
12 Use of scanning near-field optical microscope with an aperture probe for detection of luminescent nanodiamond
777KB
2019/07/01
11DETECTIONOFLUMINESCENTNANODIAMONDSUSINGASCANNINGNEAR-FIELDOPTICALMICROSCOPEWITHANAPERTUREPROBE
11DETECTIONOFLUMINESCENTNANODIAMONDSUSINGASCANNINGNEAR-FIELDOPTICALMICROSCOPEWITHANAPERTUREPROBE
431KB
2019/07/01
10 Comparative study of post-growth annealing of Cu(hfac)2, Co2(CO)8 and Me2Au(acac)
10 Comparative study of post-growth annealing of Cu(hfac)2, Co2(CO)8 and Me2Au(acac) metal precursors deposited by FEBID
10047KB
2019/07/01
9 Tuning the photo-response in monolayer MoS2 by plasmonic nano-antenna
9 Tuning the photo-response in monolayer MoS2 by plasmonic nano-antenna
1156KB
2019/07/01
8 Fabrication of probes for scanning near-field optical microscopy using focused ion beam
8 Fabrication of probes for scanning near-field optical microscopy using focused ion beam
882KB
2019/07/01
7 Probing optical near-fields with photoreactive azo-polymers
7 Probing optical near-fields with photoreactive azo-polymers
976KB
2019/07/01
6 Investigation of Spatial Distribution of Photocurrent in the Plane of a Si p–n Photodiode
6 Investigation of Spatial Distribution of Photocurrent in the Plane of a Si p–n Photodiode with GeSi Nanoislands by Scanning Near-Field Optical Microscopy
445KB
2019/07/01
5 Scanning near-field microscopy of microdisk resonator with InP_GalnP quantum dots
5 Scanning near-field microscopy of microdisk resonator with InP_GalnP quantum dots using cantilever-based probes
1487KB
2019/07/01
4DependenceoftheFocalSpotParametersontheReliefHeightoftheAmplitudeZonePlate
4DependenceoftheFocalSpotParametersontheReliefHeightoftheAmplitudeZonePlate
880KB
2019/07/01
3 Tight Focusing of Circularly Polarized Laser Light by Amplitude Zone Plate with Chromium Rings
3 Tight Focusing of Circularly Polarized Laser Light by Amplitude Zone Plate with Chromium Rings
167KB
2019/07/01
2Tight focusing of laser light using a chromium Fresnel zone plate
2Tight focusing of laser light using a chromium Fresnel zone plate
2528KB
2019/07/01
1Complex for Nanoscale Researches by Using TERS, SNOM, BLS, and SPM Techniques
1Complex for Nanoscale Researches by Using TERS, SNOM, BLS, and SPM Techniques
1465KB
2019/07/01
SNOM近场光学显微镜
原理:用超越激光衍射极限的系统来研究样品 NTEGRA Spectra 在检测样品时,通过扫描近场光学显微术能提供超越激光光学衍射的光学分辨率。 支持两种不同的SNOM方式:光纤式SNOM和悬臂梁式SNOM所有的SNOM功能模式:透射模式,反射模式,收集模式。
5704KB
2019/06/27
NT-MDT AFM+Raman+SNOM原子力拉曼近场联用系统
为了研究针尖增强拉曼(TERS),NTEGRA Spectra实现了光谱仪/显微镜在纳米尺度的分辨率。特制的AFM探针可以使TERS信号增强,并且使光以纳米尺度聚焦到针尖区域。这种特制的AFM探针充当了一个纳米光源,使光学成像的分辨率突破了光的衍射极限,达到10nm。
3886KB
2019/06/27
NTEGRA PRIMA NT-MDT原子力显微镜
Prima 具有40 多种常规的SPM ,光谱和刻蚀工作模式。因此, Prima 可以及其方便地对样品进行高精度和高分辨成像。Prima 广泛应用于材料科学、生命科学、聚合物等诸多领域样品物理和化学特性的研究。
1093KB
2019/06/27
PFM压电响应力显微镜
本资料介绍了压电响应力原子力的原理及应用,包括我们产品的特色及参数。比较全面的介绍了产品的特征,性能稳定,操作简单等特点。
1022KB
2019/06/27
Magnetic_Force_Microscopy_nanoscale_magnetic_imaging_and_lithograph
The principle of Magnetic Force Microscopy (MFM) is based on the detection of the interaction between the sample and a nanosized magnetic probe
527KB
2019/06/27
开尔文探针力显微镜在光电领域应用
The Sun is an abundant, easily accessible power source that is currently underutilized, will possibly become the no-alternative choice for electrical power of humankind
2092KB
2019/06/27
EFM
The electrostatic interaction between a model probe and a sample in a scanning probe microscope is analyzed. A simple model for a real experimental setup is proposed and solved by means of an appropriate approximation. In addition, a quantitative definition for resolution is presented. We find that generally the total force between tip and sample is dominated by contributions which are not confined to a nanometer-sized region under the tip apex.
425KB
2019/06/27
Electrochemistry at nanoscale
Electrochemical (EC) technologies attract constantly rising interest because it is the way for controlled modifications of the surface even with atomic precision. EC deposition is a widely used approach for creation of thin metal films with unique properties. On the other hand EC dissolution allows imitation and study of corrosion processes. Scanning probe microscopy
466KB
2019/06/27
八帆仪器设备(上海)有限公司
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上海市闵行区新骏环路189号漕河泾开发区创新创业园C座413室
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