2008-06-17 16:55
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全球领先测量仪器制造商美国Veeco公司,将于“2008中国国际轴承及其专用设备展览会”同期举办光学干涉表征技术研讨会。
The atomic force microscope (AFM) offers extraordinarily high resolution in force measurement applications, routinely yielding useful data down to the thermal noise floor of the cantilever, typically about 10pN. This along with the ease with which it is applied to many biological systems has made it a popular tool for studying such things as the specific interactions between biomolecules, the forces required to stretch polymeric molecules, and the forces that stabilize proteins. These sorts of applications have come to be collectively referred to as “force spectroscopy” applications.
EnviroScope SPM 结合了模式化的环境控制器、密封样品池和多种成像模式于一体,为科学研究和工业应用提供了出色的应用适应性。系统带有高真空、气体和液体倾注和交换附件以及加热附件,环境控制池可以在一系列复杂的环境变化条件下观察样品的反应。基于工业标准的 Dimension 扫描头包含有压电扫描管、激光和四相限光学检测器,以确保成像效果和数据可靠性。
Dimension 5000 SPM具有对大样品的自动成像能力,使之在半导体和数据存储设备的制造过程中广泛使用,它能够测量直径达350 mm的样品上测量100多个区域。它具有原子力显微镜和扫描隧道显微镜的全部配置,可以在三维尺寸上探测缺陷、测量表面粗糙度和其它特征,测量过程对样品无损伤并且无需对样品进行预处理和修饰。