| Introducing the first truly 3 Dimensional Scanning Electron Microscope |
| 关 键
词： |
the ELECTRON microscope |
| 资料类型： |
PDF文档 |
| 资料大小： |
499K |
| 资料类别： |
仪器资料 |
| 资料来源： |
FEI公司 |
| 适用对象： |
所有 |
| 所属仪器： | Quanta 3D FEG "双束"(SEM/FIB)显微镜（Quanta 3D FEG） |
| 资料简介： |
By integrating FIB (Focused Ion Beam) technology into our ESEM family platforms. This is FEI’s pioneering DualBeam™ technology and system architecture.Focused Ion Beam technology provides an artefact-free method of site specific real-time micro-cross-sectioning at the point of a mouse.“Next Generation” ion beam optics mean that you can now section through a target feature no larger than 100nm and be certain that you have left the remaining half of the feature undamaged and available for immediate imaging and characterisation. |
| 上 传 人： |
FEI香港有限公司 |
| 上传时间： |
2007-3-1 12:05:45 |
| 下载次数： | |
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