搜全网
搜本展位
首页 > 资料中心 > spm-raman
仪信通铜牌会员 第 13 年
仪信通诚信认证
仪器信息网认证,请放心拨打
400-860-5168转0758
名 称: 凯戈纳斯仪器商贸(上海)有限公司
认 证: 工商信息已核实
信用积分:3377
厂商反馈速度 6-8 小时
凯戈纳斯手机版
文档下载

spm-raman

发布时间:2007/01/09 17:13 下载:136 次 免费下载
Introduction: The spatial resolution of Raman systems employing normal optical microscopes is limited to approximately the wavelength of the light (about 0.5 µm), because both the illuminating laser light and the Raman scattered light are collected in the optical far-field (i.e many wavelengths of light away from the scattering material). This resolution is sufficient for many users, but some need the higher resolutions attainable by scanning probe microscopies (SPM) such as atomic force microscopy (AFM) and near-field scanning optical microscopy (NSOM). This need can now be fulfilled by the combined Nanonics NSOM/AFM-100 Confocal™/Renishaw RM Series Raman microscope. Previously, investigating a sample with both scanning probe microscopy and Raman microscopy required moving the sample from instrument to instrument. The exact region being analyzed by the Raman microscope could not generally be found again for imaging with the chosen scanning probe microscopic technique. Direct correlation of a SPM technique with Raman scattering was a dream…now it is a reality.
仪器信息网 http://www.instrument.com.cn/ 设计制作