发布时间：2007/01/09 17:13 下载：136 次
The spatial resolution of Raman systems employing normal optical microscopes is limited to approximately the wavelength of the light (about 0.5 µm), because both the illuminating laser light and the Raman scattered light are collected in the optical far-field (i.e many wavelengths of light away from the scattering material).
This resolution is sufficient for many users, but some need
the higher resolutions attainable by scanning probe microscopies (SPM) such as atomic force microscopy (AFM) and near-field scanning optical microscopy (NSOM). This need can now be fulfilled by the combined Nanonics NSOM/AFM-100 Confocal™/Renishaw RM Series Raman
microscope. Previously, investigating a sample with both scanning probe microscopy and Raman microscopy required moving the
sample from instrument to instrument. The exact region being
analyzed by the Raman microscope could not generally be
found again for imaging with the chosen scanning probe
microscopic technique. Direct correlation of a SPM technique
with Raman scattering was a dream…now it is a reality.